Centres

Advanced Microscopy Centre

Omicron Ultra-high Vacuum Scanning Tunneling Microscope (UHV-STM)

The UHV STM/AFM consists of an Omicron UHV VT STM/AFM with the following features:

• In situ switching between STM and AFM
• Simultaneous recording of tunnelling currents (STM mode) and normal/lateral forces (AFM mode) with the same tip assembly.
• Spatial resolution of 0.1Å in z and the x-y resolution allows atomic scale images on Si(111) 7x7 to be obtained.
• Temperature range 25-1000K
• Operating pressure 2x10-10 mbar

In AFM mode the instrument modes are:

• Contact/Non-contact
• Lateral force microscopy
• Magnetic force microscopy
• Electrostatic force microscopy

In STM mode, the instrument modes are:

• Scanning Tunnelling Spectroscopy
• Scanning Tunnelling Imaging mode