Centres

Advanced Microscopy Centre

Sirion 200 Field Emission Gun Scanning Electron Microscope (FEGSEM)

The FEGSEM facility is based on a FEI Sirion 200 which is a is an ultra-high resolution Schottky field emission scanning electron microscope and  is ideal for studying materials on the nanometre scale.  The microscope is equipped with energy dispersive X-ray analysis (EDX)  and electron backscattered diffraction (EBSD).  The key features of the FEGSEM are:

  • Immersion lens electron optics and in-lens detector technology
  • High resolution secondary electron (SE) and back-scattered electron (BSE) imaging;
  • Instrument resolution  of 3.5nm at 500V, 2.5nm at 1kV and 1.5nm at 10kV
  • Scanning transmission electron microscopy (STEM)  detector for  bright-field and dark-field images of a TEM-prepared sample
  • Ultra-high resolution analysis with the STEM detector (20 nm spatial resolution EDX in STEM mode)
  • Princeton Gamma Technology Spirit energy dispersive X-ray analysis system with a 50mm2 germanium detector for light element analysis at low accelerating voltages
  • HKL Technology Channel 5 EBSD system which will allow imaging, diffraction pattern acquisition and indexing, phase identification, orientation mapping, determination of pole figures, and orientation distribution function calculations
UPDATED: 25th July 2006
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