Centres

Advanced Microscopy Centre

JEOL 2100 Transmission Electron Microscope (TEM)

The transmission electron microscope (TEM) facility comprises of a JEOL JEM-2100 LaB6 TEM.  The TEM is equipped with STEM facilities and a Princeton Gamma Technology Avalon EDX system.  The key features of the TEM are:

  • Resolution: Point 0.25nm, Lattice 0.14nm, STEM 1.0nm
  • Specimen Tilt: +/- 42°
  • Gatan 2k x 2k digital camera
  • Instrument modes include:
  • TEM
  • Selected Area Diffraction
  • Convergent Beam Diffraction
  • STEM Bright Field
  • STEM Dark Field
  • EDS Probe
  • X - Ray Mapping (With PGT)
  • X - Ray Line Scan (With PGT)
UPDATED: 25th July 2006
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